Focused Ion Beam Scanning Electron Microscopes (FIB-SEM)

Speed up nanotomography and nanofabrication applications. ZEISS FIB-SEMs let you benefit for processing and sample preparation on a nanoscopic scale for materials in life sciences as well as in industry.

 

 

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Description

Speed up nanotomography and nanofabrication applications.
ZEISS FIB-SEMs let you benefit for processing and sample preparation on a nanoscopic scale for materials in life sciences as well as in industry.

  • Combine 3D imaging, analysis and material processing
  • Profit from a next-generation FIB when preparing your sample
  • Enjoy real-time interaction and perform imaging and milling simultaneously

Crossbeam Family

Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB). You may be working in a multi-user facility, as an academic or in an industrial lab. Take advantage of ZEISS Crossbeam’s modular platform concept and upgrade your system with growing needs. During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications.

Learn in this video how the TEM lamella preparation workflow of ZEISS Crossbeam enables Benedikt Müller, University of Tuebingen, and Claus Burkhardt, NMI Reutlingen, to investigate the crystal structure of NanoSQUIDS.
  • Extract true sample information from your high resolution SEM images using Gemini electron optics
  • The Ion-sculptor FIB column introduces a new way of FIB-processing: by minimizing sample damage you’ll maximize sample quality and perform experiments faster at the same time
  • When preparing TEM samples use the low voltage capabilities of the Ion-sculptor FIB: get ultra-thin samples while keeping amorphization damage at a minimum
  • Within the ZEISS Crossbeam Family, either exploit the variable pressure capabilities of Crossbeam 350
  • Or use Crossbeam 550 for your most demanding characterizations. Enjoy even more options with the large chamber.

High Throughput 3D Analysis and Sample Preparation

Speed up ion beam milling or material removal for tomography and experience best 3D resolution in your FIB-SEM analysis.

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Customized Tools

Individual Products & Solutions

Let our example customized solutions based on Crossbeam and Merlin platforms inspire you.

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